Nanometrology calibration wafers and SEM simulation software
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Semiconductor metrology infrastructure development is critical for achieving profitable future products, and such development requires availability of high performance IP-neutral calibration artifacts, and simulation software of key metrology techniques for deeper understanding of measurement physics for optimizing metrology performance.
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AMAG nanofoundry marries the advanced new comprehensive AMAG7 metrology reticle with key process steps from foundries to build a growing library of versatile metrology-centric calibration wafers patterned in contemporary critical process levels, providing the industry a modern off-shelf IP-neutral solution for such metrology work, with full collaboration possible with any other metrology type.
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AMAG SimuSEM simulates scanning electron microscope (SEM) images and electron interactions with solids. SimuSEM provides a performant and rigorous SEM simulation with a powerful and fully-featured GUI.
Calibration Wafers/Chips
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AMAG7 Hardmask LineSpace, 100 nm depth, L50P100 anchor target
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AMAG7 HARhole, 1.0 Āµm depth, SiO2 on Si, C60P120 anchor target
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AMAG7 HARhole, 1.5 Āµm depth, SiO2 on Si, C60P120 anchor target
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AMAG6 HARhole, 1.0 Āµm depth, SiO2 on Si, C60P120 anchor target
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AMAG7 Hardmask Holes, 100 nm depth SiO2 on Si, C60P120 anchor target
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AMAG7 GI-SAXS Striplet, Hardmask LineSpace 70 nm depth, L40P100 anchor target
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Cu CMP on AMAG7 Hardmask LineSpace
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W CMP on AMAG7 Hardmask LineSpace
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Chip-AMAG7 Hardmask LineSpace, 100 nm depth, L50P100 anchor target
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Chip-AMAG7 Hardmask LineSpace, 100 nm depth, L50P100 anchor target w/TiN anti-charge coating
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Chip-AMAG7 HARhole, 1.0 Āµm depth, SiO2 on Si, C60P120 anchor target
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SimuSEM Software
AMAG SimuSEM simulates scanning electron microscope (SEM) images and electron interactions with solids. SimuSEM provides a performant and rigorous SEM simulation with a powerful and fully-featured GUI.
Key SimuSEM simulation features:
- Simulations run in the background, with results displayed in SimuSEM's GUI for analysis and detailed viewing.
- Large selection of useful geometric primitive shapes and Boolean operators to intuitively build and visualize complex 3D samples on simulation workbench.
- Discretely-defined height map objects for rough features, surfaces and edges.
- A growing database of material physical models validated to experimental results from the literature, with a path to adding more and validating models to experimental SE yield curves.
- Adjustable beam energies, beam spot sizes and tilt beam, user-defined discrete detectors with tunable energy windows, and other SEM variants.
- Results images for SE, BSE or user-defined energy windows, viewable top-down and in 3D.
- Energy, angle & detector hit histograms/maps, and energy absorption maps.
- Fully viewable electron trajectories in 2D & 3D.